AI helps microscopes find the most informative nanoscale features in a sample
Researchers at the Department of Energy's Oak Ridge National Laboratory (ORNL) have developed an artificial intelligence framework that helps researchers use atomic force microscopes to identify important nanoscale features while autonomously targeting the most informative areas
Researchers at the Department of Energy's Oak Ridge National Laboratory (ORNL) have developed an artificial intelligence framework that helps researchers use atomic force microscopes to identify important nanoscale features while autonomously targeting the most informative areas This story matters for Science & Discovery readers tracking mech. Reported by phys.org. Read the full original at the source link below.
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